DocumentCode :
1156271
Title :
Three-dimensional model of gate current flow in thyristor. I. Description
Author :
Lisik, Zbigniew ; Turowski, Marek
Author_Institution :
Inst. of Electron., Tech. Univ., Lodz, Poland
Volume :
37
Issue :
5
fYear :
1990
fDate :
5/1/1990 12:00:00 AM
Firstpage :
1383
Lastpage :
1388
Abstract :
The digital gate concept is one of the fundamental ways leading to improvement of the dynamic rates of a thyristor. The distribution of the current density of the gate-cathode junction along the edge of the gate contact must, however, be as uniform as possible. A numerical model which permits determination of this distribution, the initial turn-on area, and their dependence on constructional parameters is proposed. The three-dimensional model includes the gate contact layer, the cathode layer, and the p-base layer. It consists of two coupled submodels: a one-dimensional submodel describing the current flow through the arm of the gate contact, and a two-dimensional one modeling the current flow inside the semiconductor bulk of the thyristor. The second submodel was developed in two versions: an exact 2-D submodel based on the solution of the semiconductor structure equations, and a lumped-parameter GP submodel based on the Gummel-Poon approach. The proposed model allows fast multiple analysis even on a personal computer
Keywords :
current density; electronic engineering computing; semiconductor device models; thyristors; 2D submodel; Gummel-Poon approach; cathode layer; current density distribution; digital gate concept; dynamic rates; gate contact layer; gate current flow; gate-cathode junction; lumped-parameter GP submodel; numerical model; one-dimensional submodel; p-base layer; semiconductor structure equations; three-dimensional model; thyristor; turn-on area; Application software; Cathodes; Current density; Doping profiles; Electrodes; Helium; Microcomputers; Numerical models; Poisson equations; Thyristors;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/16.108201
Filename :
108201
Link To Document :
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