• DocumentCode
    1156271
  • Title

    Three-dimensional model of gate current flow in thyristor. I. Description

  • Author

    Lisik, Zbigniew ; Turowski, Marek

  • Author_Institution
    Inst. of Electron., Tech. Univ., Lodz, Poland
  • Volume
    37
  • Issue
    5
  • fYear
    1990
  • fDate
    5/1/1990 12:00:00 AM
  • Firstpage
    1383
  • Lastpage
    1388
  • Abstract
    The digital gate concept is one of the fundamental ways leading to improvement of the dynamic rates of a thyristor. The distribution of the current density of the gate-cathode junction along the edge of the gate contact must, however, be as uniform as possible. A numerical model which permits determination of this distribution, the initial turn-on area, and their dependence on constructional parameters is proposed. The three-dimensional model includes the gate contact layer, the cathode layer, and the p-base layer. It consists of two coupled submodels: a one-dimensional submodel describing the current flow through the arm of the gate contact, and a two-dimensional one modeling the current flow inside the semiconductor bulk of the thyristor. The second submodel was developed in two versions: an exact 2-D submodel based on the solution of the semiconductor structure equations, and a lumped-parameter GP submodel based on the Gummel-Poon approach. The proposed model allows fast multiple analysis even on a personal computer
  • Keywords
    current density; electronic engineering computing; semiconductor device models; thyristors; 2D submodel; Gummel-Poon approach; cathode layer; current density distribution; digital gate concept; dynamic rates; gate contact layer; gate current flow; gate-cathode junction; lumped-parameter GP submodel; numerical model; one-dimensional submodel; p-base layer; semiconductor structure equations; three-dimensional model; thyristor; turn-on area; Application software; Cathodes; Current density; Doping profiles; Electrodes; Helium; Microcomputers; Numerical models; Poisson equations; Thyristors;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/16.108201
  • Filename
    108201