• DocumentCode
    1156381
  • Title

    Finite difference time domain analysis of two-layer multi-coupled microstrip lines on anisotropic substrates

  • Author

    Seo, Chulhun

  • Author_Institution
    Dept. of Electr. Eng. & Comput. Sci., MIT, Cambridge, MA, USA
  • Volume
    30
  • Issue
    5
  • fYear
    1994
  • fDate
    9/1/1994 12:00:00 AM
  • Firstpage
    3176
  • Lastpage
    3179
  • Abstract
    The general expressions of the finite difference method (FDM) and the finite difference time domain (FDTD) method are obtained for the quasi-static and full wave analysis, respectively. Maxwell´s equations are replaced by a set of finite difference equations which are eigenvalue problems in FDTD. The even and odd mode capacitances are presented for various ratios of the widths of microstrip line in the first layer to the thickness of the first layer in two-layer three-coupled microstrip lines on anisotropic substrates in the quasi-static analysis. The effective dielectric constants are obtained for frequency in the full wave analysis and are compared with those of spectral domain method
  • Keywords
    eigenvalues and eigenfunctions; finite difference time-domain analysis; microstrip lines; permittivity; waveguide theory; anisotropic substrates; effective dielectric constants; eigenvalue problems; even mode capacitances; finite difference time domain analysis; full wave analysis; odd mode capacitances; quasi-static analysis; two-layer multi-coupled microstrip lines; Anisotropic magnetoresistance; Capacitance; Dielectric substrates; Difference equations; Eigenvalues and eigenfunctions; Finite difference methods; Genetic expression; Maxwell equations; Microstrip; Time domain analysis;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/20.312612
  • Filename
    312612