• DocumentCode
    1156405
  • Title

    Direct Observation of PFPE Lubricants on Magnetic Disks

  • Author

    Tani, Hiroshi ; Tagawa, Norio

  • Author_Institution
    Dept. of Mech. Eng., Kansai Univ., Suita
  • Volume
    45
  • Issue
    2
  • fYear
    2009
  • Firstpage
    862
  • Lastpage
    866
  • Abstract
    Perfluoropolyether lubricant films on magnetic disks were observed by means of atomic force microscopy (AFM) with a fluoride-coated probe. The lubricant films could be observed directly because the adhesion force was decreased by the anti-wetting effect of the fluoride coating on the probes. We compared the molecular conformation of Z-dol (Mw: 2000, 3000, 6000, 8000) with that of Z-tetraol. Thus, we found that the film coverage of a lubricant with high molecular weight exhibited varying (i.e., higher and lower) step heights of the lubricant film boundary. The Z-tetraol film exhibited higher coverage and the higher step height as compared to Z-dol2000. To further study the step height measured by means of atomic force microscopy, we compared the step height with the shoulder height of the spreading profiles of the films. The step heights were almost equal to the shoulder height. We observed the lubricant film after shearing by using contact scanning mode atomic force microscopy. The coverage of the sheared lubricant film increased higher than the initial coverage before shearing. Subsequently, the lubricant molecular conformation was varied due to the shearing, and the coverage was increased.
  • Keywords
    adhesion; atomic force microscopy; lubricants; magnetic heads; polymer films; shearing; wetting; PFPE; Z-tetraol film; adhesion force; antiwetting effect; atomic force microscopy; fluoride-coated probe; lubricant molecular conformation; magnetic disks; magnetic heads; molecular weight; perfluoropolyether lubricant films; scanning mode atomic force microscopy; shearing; Atomic force microscope; lubricant; magnetic disk; perfluoropolyether;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/TMAG.2008.2010655
  • Filename
    4782096