Title :
Grain Topography in Perpendicular Thin-Film Media and Impact of Possible Surface Anisotropy
Author :
Zhu, Jian-Gang ; Yuan, Hua ; Park, Soyoung ; Nuhfer, Thomas ; Laughlin, David E.
Author_Institution :
Data Storage Syst. Center, Carnegie Mellon Univ., Pittsburgh, PA
Abstract :
In this paper, we present a combined transmission electron microscopy study and micromagnetic modeling investigation of current granular-continuous-composite (CGC) perpendicular thin-film media. Our transmission electron microscopy-EELS elemental analysis on CoCrPt-TiOx layers found evident Cr segregation to the grain boundaries as well as in the middle of a grain where Co and Pt appears to be deficient. Similar localized Co and Pt deficiency is also found in CoCrPt-SiOx media, however, Cr segregation is much less evident. STEM-HAADF analysis reveals that the apparent non-uniform composition is the result of a ldquocavity-likerdquo topography of the magnetic grains. It is argued that the ldquocavityrdquo grain topography significantly enhances the grain boundary surface area. Micromagnetic modeling investigation was conducted to study the impact of possible surface anisotropy to the corresponding grain switching field. A systematic numerical analysis is presented.
Keywords :
chromium alloys; cobalt alloys; electron energy loss spectra; grain boundaries; grain boundary segregation; granular materials; magnetic switching; magnetic thin films; micromagnetics; perpendicular magnetic anisotropy; platinum alloys; silicon compounds; surface segregation; surface topography; titanium compounds; transmission electron microscopy; CoCrPt-SiOx; CoCrPt-TiOx; EELS; cavity grain topography; elemental analysis; grain boundaries; grain boundary surface area; grain switching field; granular magnetic layer; granular-continuous-composite perpendicular thin-film media; magnetic grains; micromagnetic modeling; segregation; surface anisotropy; transmission electron microscopy; Perpendicular recording media; surface anisotropy; switching field; thin-film media;
Journal_Title :
Magnetics, IEEE Transactions on
DOI :
10.1109/TMAG.2008.2010674