Title :
Simplifying and interpreting two-tone measurements
Author :
Remley, Kate A. ; Williams, Dylan F. ; Schreurs, Dominique M M-P ; Wood, John
Author_Institution :
Nat. Inst. of Stand. & Technol., Boulder, CO, USA
Abstract :
We develop a mathematical description of the response of weakly nonlinear systems to second-order memory mechanisms. Our description is based on a time-varying gain-modulation function. We show that intermodulation (IM) products arising from interactions at baseband have phase symmetries different from both interactions at second harmonic frequencies and gain compression and, thus, may be readily distinguished through measurement. We also demonstrate a technique for measuring and aligning the phase of IM products outside the measurement bandwidth of our instrumentation to identify contributions to memory with broad frequency response.
Keywords :
Fourier transforms; frequency response; intermodulation distortion; intermodulation measurement; nonlinear systems; time-varying networks; wideband amplifiers; Fourier transforms; broad frequency response; gain compression; gain modulation function; intermodulation products; network analysers; nonlinear systems; second harmonic frequency; second order memory mechanisms; time varying function; two tone measurements; wideband amplifiers; Bandwidth; Baseband; Circuits; Distortion measurement; Frequency measurement; Gain measurement; Instruments; Phase measurement; Power harmonic filters; Radiofrequency amplifiers; 65; Gain modulation; IM; NVNA; distortion; intermodulation; large-signal network analyzer; memory effects; nonlinear vector network analyzer; two-tone measurements;
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
DOI :
10.1109/TMTT.2004.837195