• DocumentCode
    1156607
  • Title

    Resonance reflection of acoustic waves in piezoelectric bi-crystalline structures

  • Author

    Darinskii, Alexander N. ; Weihnacht, Manfred

  • Author_Institution
    Inst. of Crystallogr., Russian Acad. of Sci., Moscow, Russia
  • Volume
    52
  • Issue
    5
  • fYear
    2005
  • fDate
    5/1/2005 12:00:00 AM
  • Firstpage
    904
  • Lastpage
    910
  • Abstract
    The paper studies the bulk wave reflection from internal interfaces in piezoelectric media. The interfaces of two types have been considered. Infinitesimally thin metallic layer inserted into homogeneous piezoelectric crystal of arbitrary symmetry. Rigidly bonded crystals whose piezoelectric coefficients differ by sign but the other material constants are identical. Analytic expressions for the coefficients of mode conversion have been derived. An analysis has been carried out of specific singularities arising when the angle of incidence is such that the resonance excitation of leaky interface acoustic waves occurs. The conditions for the resonance total reflection have been established. The computations performed for lithium niobate (LiNbO/sub 3/) illustrate general conclusions.
  • Keywords
    acoustic resonance; acoustic wave reflection; metallic thin films; piezoceramics; piezoelectricity; LiNbO/sub 3/; acoustic waves resonance reflection; analytic expressions; bonded crystals; bulk wave reflection; homogeneous piezoelectric crystal; incidence angle; internal interfaces; leaky interface acoustic waves; lithium niobate; material constants; mode conversion; piezoelectric bicrystalline structures; piezoelectric coefficients; piezoelectric media; resonance excitation; resonance total reflection; thin metallic layer; Acoustic reflection; Acoustic waves; Anisotropic magnetoresistance; Bonding; Crystalline materials; Crystals; Electric potential; Piezoelectric materials; Resonance; Solid state circuits;
  • fLanguage
    English
  • Journal_Title
    Ultrasonics, Ferroelectrics, and Frequency Control, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0885-3010
  • Type

    jour

  • DOI
    10.1109/TUFFC.2005.1503976
  • Filename
    1503976