• DocumentCode
    1156759
  • Title

    Laser Simulation of SEE Due to Localized Ionization in Dielectric Structures

  • Author

    Chugg, Andrew M. ; English, Roger ; Parker, Sarah ; Burnell, Andrew J.

  • Author_Institution
    MBDA UK Ltd., Bristol
  • Volume
    56
  • Issue
    1
  • fYear
    2009
  • Firstpage
    294
  • Lastpage
    298
  • Abstract
    This paper reports an investigation of the use of two-photon absorption (TPA) of blue laser pulses and production of ultraviolet pulses through second harmonic generation (SHG) to simulate single event effects involving ionization and charge trapping in dielectrics.
  • Keywords
    dielectric materials; laser beams; microchip lasers; optical harmonic generation; photoionisation; two-photon processes; blue laser pulses; charge trapping; laser simulation; localized ionization; microchip dielectric structures; second harmonic generation; single event effects; two-photon absorption; ultraviolet pulse production; Dielectrics; Electromagnetic wave absorption; Ionization; Laser transitions; Microchip lasers; Optical harmonic generation; Optical pulse generation; Optical pulses; Pulse amplifiers; Testing; Ionization; lasers; single event effects; ultraviolet radiation effects;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.2008.2009450
  • Filename
    4782129
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1156759