• DocumentCode
    1156842
  • Title

    Estimation of Nonlinear Errors-in-Variables Models for Computer Vision Applications

  • Author

    Matei, B.C. ; Meer, P.

  • Author_Institution
    Vision Technol. Lab., Sarnoff Corp., Princeton, NJ
  • Volume
    28
  • Issue
    10
  • fYear
    2006
  • Firstpage
    1537
  • Lastpage
    1552
  • Abstract
    In an errors-in-variables (EIV) model, all the measurements are corrupted by noise. The class of EIV models with constraints separable into the product of two nonlinear functions, one solely in the variables and one solely in the parameters, is general enough to represent most computer vision problems. We show that the estimation of such nonlinear EIV models can be reduced to iteratively estimating a linear model having point dependent, i.e., heteroscedastic, noise process. Particular cases of the proposed heteroscedastic errors-in-variables (HEIV) estimator are related to other techniques described in the vision literature: the Sampson method, renormalization, and the fundamental numerical scheme. In a wide variety of tasks, the HEIV estimator exhibits the same, or superior, performance as these techniques and has a weaker dependence on the quality of the initial solution than the Levenberg-Marquardt method, the standard approach toward estimating nonlinear models
  • Keywords
    computer vision; error analysis; nonlinear estimation; nonlinear functions; computer vision; heteroscedastic errors-in-variables estimator; nonlinear errors-in-variables models; nonlinear estimation; nonlinear functions; Additive noise; Application software; Computer Society; Computer errors; Computer vision; Estimation error; Mathematical model; Noise measurement; Noise reduction; Q measurement; 3D rigid motion; Nonlinear least squares; camera calibration; heteroscedastic regression; uncalibrated vision.; Algorithms; Artificial Intelligence; Computer Simulation; Data Interpretation, Statistical; Image Enhancement; Image Interpretation, Computer-Assisted; Information Storage and Retrieval; Models, Statistical; Nonlinear Dynamics; Pattern Recognition, Automated; Reproducibility of Results; Sensitivity and Specificity;
  • fLanguage
    English
  • Journal_Title
    Pattern Analysis and Machine Intelligence, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0162-8828
  • Type

    jour

  • DOI
    10.1109/TPAMI.2006.205
  • Filename
    1677513