• DocumentCode
    1156854
  • Title

    Understanding MOSFET mismatch for analog design

  • Author

    Drennan, Patrick G. ; McAndrew, Colin C.

  • Author_Institution
    Motorola Inc., Tempe, AZ, USA
  • Volume
    38
  • Issue
    3
  • fYear
    2003
  • fDate
    3/1/2003 12:00:00 AM
  • Firstpage
    450
  • Lastpage
    456
  • Abstract
    Despite the significance of matched devices in analog circuit design, mismatch modeling for design application has been lacking. This paper addresses misconceptions about MOSFET mismatch for analog design. Vt mismatch does not follow a simplistic 1/(√area) law, especially for wide/short and narrow/long devices, which are common geometries in analog circuits. Further, Vt and gain factor are not appropriate parameters for modeling mismatch. A physically based mismatch model can be used to obtain dramatic improvements in prediction of mismatch. This model is applied to MOSFET current mirrors to show some nonobvious effects over bias, geometry, and multiple-unit devices.
  • Keywords
    MOSFET; SPICE; analogue integrated circuits; current mirrors; integrated circuit design; semiconductor device models; MOSFET current mirrors; MOSFET mismatch; SPICE; analog IC design; analog circuit design; gain factor; physically based mismatch model; semiconductor device modeling; threshold voltage mismatch; Analog circuits; Analog integrated circuits; Computational geometry; Immune system; MOSFET circuits; Mirrors; Predictive models; SPICE; Semiconductor device modeling; Solid modeling;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/JSSC.2002.808305
  • Filename
    1183852