DocumentCode :
1156883
Title :
A multibit sigma-delta ADC for multimode receivers
Author :
Miller, Matthew R. ; Petrie, Craig S.
Author_Institution :
Motorola Inc., Schaumburg, IL, USA
Volume :
38
Issue :
3
fYear :
2003
fDate :
3/1/2003 12:00:00 AM
Firstpage :
475
Lastpage :
482
Abstract :
A 2.7-V sigma-delta modulator with a 6-bit quantizer is fabricated in a 0.18-μm CMOS process. The modulator makes use of noise-shaped dynamic element matching (DEM) and quantizer offset chopping to attain high linearity over a wide bandwidth. The DEM algorithm is implemented in such a way as to minimize additional delay within the feedback loop of the modulator, thereby enabling the use of the highest resolution quantizer yet reported in a multibit sigma-delta analog-to-digital converter of this speed. The part achieves 95-dB peak spurious-free dynamic range and 77-dB signal-to-noise ratio over a 625-kHz bandwidth, and consumes 30 mW at a sampling frequency of 23 MHz. The part achieves 70-dB signal-to-noise ratio over a 1.92-MHz bandwidth and dissipates 50 mW when clocked at 46 MHz.
Keywords :
CMOS integrated circuits; cellular radio; circuit feedback; integrated circuit design; integrated circuit noise; mixed analogue-digital integrated circuits; radio receivers; sigma-delta modulation; 0.18 micron; 0.18-μm CMOS process; 1.92 MHz; 2.7 V; 23 MHz; 30 mW; 46 MHz; 50 mW; 6 bit; 6-bit quantizer; 625 kHz; delay minimization; direct-conversion cellular receivers; direct-conversion radio receiver; high linearity; high resolution quantizer; mixed-signal integrated circuit; modulator feedback loop; multibit sigma-delta ADC; multibit sigma-delta analog-to-digital converter; multimode receivers; noise-shaped dynamic element matching; power consumption; power dissipation; quantizer offset chopping; sampling frequency; signal-to-noise ratio; spurious-free dynamic range; wide bandwidth; Added delay; Analog-digital conversion; Bandwidth; CMOS process; Delta-sigma modulation; Dynamic range; Feedback loop; Linearity; Signal resolution; Signal to noise ratio;
fLanguage :
English
Journal_Title :
Solid-State Circuits, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9200
Type :
jour
DOI :
10.1109/JSSC.2002.808321
Filename :
1183855
Link To Document :
بازگشت