DocumentCode :
1156906
Title :
Graphical Models and Point Pattern Matching
Author :
Caetano, T.S. ; Caelli, T. ; Schuurmans, D. ; Barone, D.A.C.
Author_Institution :
Nat. ICT Australia, Canberra, ACT
Volume :
28
Issue :
10
fYear :
2006
Firstpage :
1646
Lastpage :
1663
Abstract :
This paper describes a novel solution to the rigid point pattern matching problem in Euclidean spaces of any dimension. Although we assume rigid motion, jitter is allowed. We present a noniterative, polynomial time algorithm that is guaranteed to find an optimal solution for the noiseless case. First, we model point pattern matching as a weighted graph matching problem, where weights correspond to Euclidean distances between nodes. We then formulate graph matching as a problem of finding a maximum probability configuration in a graphical model. By using graph rigidity arguments, we prove that a sparse graphical model yields equivalent results to the fully connected model in the noiseless case. This allows us to obtain an algorithm that runs in polynomial time and is provably optimal for exact matching between noiseless point sets. For inexact matching, we can still apply the same algorithm to find approximately optimal solutions. Experimental results obtained by our approach show improvements in accuracy over current methods, particularly when matching patterns of different sizes
Keywords :
computational complexity; geometry; graph theory; jitter; pattern matching; Euclidean spaces; graph matching; graphical models; jitter; noiseless point sets; noniterative polynomial time algorithm; point pattern matching; Application software; Charge-coupled image sensors; Computer vision; Graphical models; Jitter; Markov random fields; Pattern matching; Pattern recognition; Polynomials; Stereo vision; Markov random fields; Point pattern matching; graph matching; graphical models; junction tree algorithm.; Algorithms; Artificial Intelligence; Computer Graphics; Computer Simulation; Image Enhancement; Image Interpretation, Computer-Assisted; Information Storage and Retrieval; Models, Statistical; Numerical Analysis, Computer-Assisted; Pattern Recognition, Automated; Signal Processing, Computer-Assisted; Subtraction Technique;
fLanguage :
English
Journal_Title :
Pattern Analysis and Machine Intelligence, IEEE Transactions on
Publisher :
ieee
ISSN :
0162-8828
Type :
jour
DOI :
10.1109/TPAMI.2006.207
Filename :
1677520
Link To Document :
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