DocumentCode
1157134
Title
Biparametric linear estimation for CFAR against Weibull clutter
Author
Guida, Maurizio ; Longo, Maurizio ; Lops, Marco
Author_Institution
Dept. of Stat. & Reliability, Consiglio Nazionale delle Ricerche, Naples, Italy
Volume
28
Issue
1
fYear
1992
fDate
1/1/1992 12:00:00 AM
Firstpage
138
Lastpage
151
Abstract
The authors deal with constant false alarm rate (CFAR) procedures against nonstationary clutter, modeled as a Weibull distributed process whose scale parameter α and shape parameter β are both variable. It is shown that conventional CFAR procedures, which compensate only for α, degrade intolerably as β deviates from β=2, namely, as the Rayleigh distributional assumption is violated. A biparametric CFAR procedure is shown to be suited to such situations. The authors introduce a logarithmic transformation to reduce the Weibull probability density function (pdf) to a Gumbel pdf, i.e., to the location-scale type, and then exploit the best linear unbiased estimation (BLUE) of location-scale parameters to adjust the detection threshold. True CFAR is thus achieved when the clutter is locally homogeneous. Resilience against local inhomogeneities can also be conferred since BLUE lends itself to censoring. Through a performance analysis, the influence of various system and distributional parameters is elicited
Keywords
estimation theory; probability; radar clutter; signal detection; signal processing; Gumbel; Rayleigh distributional assumption; Weibull clutter; Weibull distributed process; Weibull probability density function; best linear unbiased estimation; biparametric CFAR; biparametric linear estimation; censoring; constant false alarm rate; detection threshold; local inhomogeneities; location-scale parameters; logarithmic transformation; nonstationary clutter; performance analysis; radar clutter; scale parameter; shape parameter; signal processing; Clutter; Degradation; Maintenance engineering; Probability density function; Radar signal processing; Reliability engineering; Resilience; Shape; Statistical distributions; Testing;
fLanguage
English
Journal_Title
Aerospace and Electronic Systems, IEEE Transactions on
Publisher
ieee
ISSN
0018-9251
Type
jour
DOI
10.1109/7.135440
Filename
135440
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