• DocumentCode
    1157411
  • Title

    Symbolic time-series analysis for anomaly detection in mechanical systems

  • Author

    Khatkhate, Amol ; Ray, Asok ; Keller, Eric ; Gupta, Shalabh ; Chin, Shin C.

  • Author_Institution
    Pennsylvania State Univ., University Park, PA
  • Volume
    11
  • Issue
    4
  • fYear
    2006
  • Firstpage
    439
  • Lastpage
    447
  • Abstract
    This paper examines the efficacy of a novel method for anomaly detection in mechanical systems, which makes use of a hidden Markov model, derived from the time-series data of pertinent measurement(s). The core concept of the anomaly detection method is symbolic time-series analysis that is built upon the principles of Automata Theory, Information Theory, and Pattern Recognition. The performance of this method is compared with that of other existing pattern-recognition techniques from the perspective of early detection of small fatigue cracks in ductile alloy structures. The experimental apparatus, on which the anomaly detection method is tested, is a multi-degree-of-freedom mass-beam structure excited by oscillatory motion of two electromagnetic shakers. The evolution of fatigue crack damage at one or more failure sites are detected from symbolic time-series analysis of displacement sensor signals
  • Keywords
    beams (structures); crack detection; hidden Markov models; pattern recognition; time series; anomaly detection; electromagnetic shakers; fatigue crack damage; hidden Markov model; mechanical systems; multi-degree-of-freedom mass-beam structure; pattern-recognition techniques; symbolic time-series analysis; Automata; Fatigue; Hidden Markov models; Information analysis; Information theory; Mechanical systems; Mechanical variables measurement; Pattern analysis; Pattern recognition; Time series analysis; Anomaly detection; fatigue crack damage; symbolic dynamics; time-series analysis;
  • fLanguage
    English
  • Journal_Title
    Mechatronics, IEEE/ASME Transactions on
  • Publisher
    ieee
  • ISSN
    1083-4435
  • Type

    jour

  • DOI
    10.1109/TMECH.2006.878544
  • Filename
    1677576