• DocumentCode
    1157449
  • Title

    Expert systems tactics in testing FASTBUS segment interconnect modules (lessons so far in the SIDES project)

  • Author

    Knowles, R.N. ; Forster, R. ; Ho, N. ; Kroma, J.

  • Author_Institution
    Fermi Nat. Accel. Lab., Batavia, IL, USA
  • Volume
    36
  • Issue
    5
  • fYear
    1989
  • fDate
    10/1/1989 12:00:00 AM
  • Firstpage
    1499
  • Lastpage
    1501
  • Abstract
    The FASTBUS segment interconnect (SI) module, which is among the most complex modules to diagnose and repair, is an intermediary device that provides a temporary connection between two otherwise independent FASTBUS segments. Internal SI problems typically manifest themselves elsewhere within the segments served. Offline testing of this sophisticated device is equally challenging. To address these problems, an exploratory project called the Segment Interconnect Diagnostic Expert System (SIDES) has been launched. The goals are to evaluate the technology and to create a more effective and streamlined testing schema. Some of the issues which have arisen during the initial phases of this project are presented
  • Keywords
    computer equipment testing; computer interfaces; expert systems; FASTBUS segment interconnect modules; Segment Interconnect Diagnostic Expert System; Backplanes; Computer interfaces; Diagnostic expert systems; Expert systems; Face detection; Fastbus; Instruments; Laboratories; Life estimation; System testing;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/23.41091
  • Filename
    41091