• DocumentCode
    1157777
  • Title

    High-performance carbon nanotube field-effect transistor with tunable polarities

  • Author

    Lin, Yu-Ming ; Appenzeller, Joerg ; Knoch, Joachim ; Avouris, Phaedon

  • Author_Institution
    IBM T. J. Watson Res. Center, Yorktown Heights, NY, USA
  • Volume
    4
  • Issue
    5
  • fYear
    2005
  • Firstpage
    481
  • Lastpage
    489
  • Abstract
    State-of-the-art carbon nanotube field-effect transistors (CNFETs) behave as Schottky-barrier-modulated transistors. It is known that vertical scaling of the gate oxide significantly improves the performance of these devices. However, decreasing the oxide thickness also results in pronounced ambipolar transistor characteristics and increased drain leakage currents. Using a novel device concept, we have fabricated high-performance enhancement-mode CNFETs exhibiting n- or p-type unipolar behavior, tunable by electrostatic and/or chemical doping, with excellent OFF-state performance and a steep subthreshold swing (S=63 mV/dec). The device design allows for aggressive oxide thickness and gate-length scaling while maintaining the desired device characteristics.
  • Keywords
    Schottky gate field effect transistors; carbon nanotubes; leakage currents; nanoelectronics; nanotube devices; reviews; C; Schottky-barrier-modulated transistors; ambipolar transistor characteristics; chemical doping; device characteristics; device design; drain leakage currents; electrostatic doping; gate oxide thickness; gate-length scaling; high-performance enhancement-mode CNFETs; n-type unipolar behavior; off-state performance; p-type unipolar behavior; state-of-the-art carbon nanotube field-effect transistor; steep subthreshold swing; tunable polarities; CNTFETs; Carbon nanotubes; Doping; Electrodes; Electrostatics; Leakage current; Schottky gate field effect transistors; Semiconductivity; Substrates; Voltage; Carbon nanotube; Schottky barrier (SB); doping; field-effect transistor;
  • fLanguage
    English
  • Journal_Title
    Nanotechnology, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1536-125X
  • Type

    jour

  • DOI
    10.1109/TNANO.2005.851427
  • Filename
    1504702