DocumentCode
1158481
Title
Generation of Unstructured Meshes for Process and Device Simulation by Means of Partial Differential Equations
Author
Cervenka, Johann ; Wessner, Wilfried ; Al-Ani, Elaf ; Grasser, Tibor ; Selberherr, Siegfried
Author_Institution
.Inst. for Microelectron., Vienna Univ. of Technol.
Volume
25
Issue
10
fYear
2006
Firstpage
2118
Lastpage
2128
Abstract
For process and device simulation, very high mesh densities are often required to obtain accurate simulation results. Unfortunately, the required mesh densities depend often on a direction. Conventional mesh-refinement strategies generate isotropic meshes with a high amount of mesh points, reaching the memory and time limits in particular for three-dimensional simulations. For a better resolution of the carrier concentrations, for instance, a boundary-conforming mesh-generation method with tunable mesh spacings in almost orthogonal directions was developed. Similar to elliptic mesh generation, the mesh points are placed inside the simulation regions based on the solution of partial differential equations. The method used can produce highly anisotropic mesh densities in the regions of particular interest. In contrast to elliptic grid generation, which produces structured grids, the method used generates triangular or tetrahedral (unstructured) Delaunay meshes in two or three dimensions, respectively, which are very well suitable for the process and device simulators
Keywords
mesh generation; partial differential equations; semiconductor device models; semiconductor process modelling; Delaunay meshes; device simulation; mesh generation; partial differential equations; process simulation; semiconductor devices; Anisotropic magnetoresistance; Finite element methods; Laboratories; MOSFETs; Mesh generation; Microelectronics; Numerical simulation; Partial differential equations; Senior members; Shape; Anisotropy; mesh generation; microelectronics; optimization techniques; semiconductors; simulation;
fLanguage
English
Journal_Title
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher
ieee
ISSN
0278-0070
Type
jour
DOI
10.1109/TCAD.2006.876514
Filename
1677695
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