DocumentCode :
1158530
Title :
Semiconductor test strategies
Author :
Ochoa, J.A. ; Porter, J.R.
Volume :
6
Issue :
1
fYear :
2003
fDate :
3/1/2003 12:00:00 AM
Firstpage :
20
Lastpage :
25
Abstract :
The test industry is currently looking for innovative solutions to address both the rising cost of testing and the growing influence that testing has on the time-to-market for new devices. These solutions include new tester technologies, new test practices and strategies, and increasing the output, experience level, and motivation of test engineers. With this in mind, this article presents a brief background on semiconductor device testing, an overview of the current issues that test engineers are facing and some of the strategies being used to overcome the rising cost of semiconductor device testing.
Keywords :
semiconductor device testing; cost; semiconductor device testing; time-to-market; Circuit testing; Cost function; Hardware; Instruments; Packaging; Production; Radio frequency; Semiconductor device testing; Software testing; Time to market;
fLanguage :
English
Journal_Title :
Instrumentation & Measurement Magazine, IEEE
Publisher :
ieee
ISSN :
1094-6969
Type :
jour
DOI :
10.1109/MIM.2003.1184273
Filename :
1184273
Link To Document :
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