DocumentCode :
11588
Title :
Evaluation of Gallium Nitride Transistors in High Frequency Resonant and Soft-Switching DC–DC Converters
Author :
Reusch, David ; Strydom, Johan
Author_Institution :
Efficient Power Conversion Corp., El Segundo, CA, USA
Volume :
30
Issue :
9
fYear :
2015
fDate :
Sept. 2015
Firstpage :
5151
Lastpage :
5158
Abstract :
The emergence of gallium nitride (GaN)-based power devices offers the potential to achieve higher efficiencies and higher switching frequencies than possible with mature silicon (Si) power MOSFETs. In this paper, we will evaluate the ability of gallium nitride transistors to improve efficiency and output power density in high frequency resonant and soft-switching applications. To experimentally verify the benefits of replacing Si MOSFETs with enhancement mode GaN transistors (eGaNFETs) in a high frequency resonant converter, 48-12 V unregulated isolated bus converter prototypes operating at a switching frequency of 1.2 MHz and an output power of up to 400 W are compared using Si and GaN power devices.
Keywords :
DC-DC power convertors; III-V semiconductors; gallium compounds; resonant power convertors; transistors; wide band gap semiconductors; zero current switching; zero voltage switching; GaN; frequency 1.2 MHz; gallium nitride transistor; high frequency resonant converter; soft-switching DC-DC converter; unregulated isolated bus converter prototypes; voltage 48 V to 12 V; Gallium nitride; Logic gates; MOSFET; Quality of service; Silicon; Zero voltage switching; DC-DC power conversion; power transistors;
fLanguage :
English
Journal_Title :
Power Electronics, IEEE Transactions on
Publisher :
ieee
ISSN :
0885-8993
Type :
jour
DOI :
10.1109/TPEL.2014.2364799
Filename :
6936376
Link To Document :
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