Title :
Mismatch robustness and security of chaotic optical communications based on injection-locking chaos synchronization
Author :
Li, Xiaofeng ; Pan, Wei ; Luo, Bin ; Ma, Dong
Author_Institution :
Southwest Jiaotong University, Chengdu
Abstract :
Mismatch robustness and its effects on security of chaotic optical communication system based on injection-locking chaos synchronization are studied numerically by establishing the corresponding SIMULINK model. Unlike previous studies, we focus on the communication relating issues when parameter mismatches are considered. The mismatch robustness of generalized synchronization is discussed firstly in terms of cross-correlation coefficient and synchronization error. Decoding performances as well as the effects of message strength are examined for both with and without mismatch cases. Effects of injection strength on system decoding performances are also investigated by examining the chaos-pass filtering effect. Finally, a modified decoding scheme is brought forward to improve the system decoding capability. Results show that the system under consideration exhibits unconspicuous difference in both synchronization and decoding characteristics when large parameter mismatches are considered. The system based on injection-locking chaos synchronization is inappropriate for the applications where high transmission security is necessary
Keywords :
chaotic communication; decoding; optical chaos; optical communication; synchronisation; telecommunication security; chaos synchronization; chaos-pass filtering effect; chaotic optical communication security; cross-correlation coefficient; decoding; injection-locking; mismatch robustness; parameter mismatch; Chaotic communication; Communication system security; Decoding; Laser feedback; Optical feedback; Optical fiber communication; Optical filters; Optical receivers; Optical transmitters; Robustness; Chaos synchronization; chaos-pass filtering; chaotic optical communications; parameter mismatch; semiconductor lasers;
Journal_Title :
Quantum Electronics, IEEE Journal of
DOI :
10.1109/JQE.2006.880379