• DocumentCode
    1159076
  • Title

    Free space measurements of negative refraction with varying angles of incidence

  • Author

    Derov, J.S. ; Turchinetz, B.W. ; Crisman, E.E. ; Drehman, A.J. ; Best, S.R. ; Wing, R.M.

  • Author_Institution
    U.S. Air Force Res. Lab., Hanscom AFB, MA, USA
  • Volume
    15
  • Issue
    9
  • fYear
    2005
  • Firstpage
    567
  • Lastpage
    569
  • Abstract
    We report free space, microwave measurements with varying incidence angle on a material that exhibits a negative index of refraction. The experiments measure the index of refraction directly, for normal incidence, on prisms with three different apex angles. Snell\´s Law and the measured index are then used to verify refraction for off-normal incidence. The metamaterials used to construct the prisms are comprised of parallel metallic layers of posts and either "Greek key" spiral or split ring resonators. Despite this highly anisotropic composition, the measured refractive index was found to be nearly constant for exit angles up to 52° off the normal to the prism hypotenuse. In addition to being the first free space experimental verification of Snell\´s Law off the optical axis for this type of metamaterial, the measurements prove that the common parallel plate structures of negative index metamaterials are not acting as guided wave media.
  • Keywords
    anisotropic media; electromagnetic wave refraction; metamaterials; microwave measurement; refractive index measurement; resonators; Greek key spiral resonator; Snell law; anisotropic media; free space measurement; incidence angle; left-handed material; metamaterials; microwave measurement; negative index media; negative refraction; parallel metallic layer; refraction index; split ring resonator; wave media; Anisotropic magnetoresistance; Extraterrestrial measurements; Geometrical optics; Metamaterials; Microwave measurements; Optical refraction; Optical ring resonators; Optical variables control; Refractive index; Spirals; Anisotropic media; left-handed materials; metamaterial; negative index media (NIM); negative index of refraction;
  • fLanguage
    English
  • Journal_Title
    Microwave and Wireless Components Letters, IEEE
  • Publisher
    ieee
  • ISSN
    1531-1309
  • Type

    jour

  • DOI
    10.1109/LMWC.2005.855371
  • Filename
    1504832