DocumentCode :
1159259
Title :
Determination of nonlinear gain coefficient of semiconductor lasers from above threshold spontaneous emission measurement
Author :
Girardin, F. ; Duan, G.-H. ; Chabran, C. ; Gallion, P. ; Blez, M. ; Allovon, M.
Author_Institution :
Dept. Commun., Ecole Nat. Superieure des Telecommun., Paris, France
Volume :
6
Issue :
8
fYear :
1994
Firstpage :
894
Lastpage :
896
Abstract :
The measurement of spontaneous emission power above threshold has shown a nearly linear increase with biasing current in a 1.55-μm InGaAs/InGaAlAs multiple quantum-well laser. Based on this measurement, we propose a novel experimental method to determine the nonlinear gain coefficient. The obtained value is 1.2×10/sup -17/ cm3 for the laser used. This value corresponds reasonably to that obtained by chirp-to-modulated-power ratio method, confirming the validity of this new measurement method.
Keywords :
III-V semiconductors; aluminium compounds; carrier density; gallium arsenide; indium compounds; laser variables measurement; nonlinear optics; semiconductor lasers; stimulated emission; 1.55 mum; InGaAs-InGaAlAs; InGaAs/InGaAlAs multiple quantum-well laser; above threshold spontaneous emission measurement; biasing current; chirp-to-modulated-power ratio method; nonlinear gain coefficient; semiconductor lasers; spontaneous emission power; Charge carrier density; Current measurement; Gain measurement; Laser modes; Power lasers; Power measurement; Quantum well lasers; Semiconductor lasers; Spontaneous emission; Stimulated emission;
fLanguage :
English
Journal_Title :
Photonics Technology Letters, IEEE
Publisher :
ieee
ISSN :
1041-1135
Type :
jour
DOI :
10.1109/68.313044
Filename :
313044
Link To Document :
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