DocumentCode :
1159269
Title :
Prediction of radiation losses and emission from a bent wire by a network model
Author :
Liu, Xilei ; Christopoulos, Christos ; Thomas, David W P
Author_Institution :
George Green Inst. for Electromagn. Res., Nottingham Univ.
Volume :
48
Issue :
3
fYear :
2006
Firstpage :
476
Lastpage :
484
Abstract :
This paper presents the modelling of the radiation characteristics of bent wires calculated through various approaches. The total radiation loss from a bent wire and the distributions of these losses are calculated analytically, leading to a rapid estimation of the maximum E field in the far field via directivity estimates. Also, an expanded Hertzian dipole approach based on the Cartesian frame is formulated, which facilitates the calculation of the E field in both the near field and the far field, and determines the radiation patterns from the bent interconnect by a simplified numerical process. Detailed radiation patterns from bent wires with various bend angles are presented in three-dimensional (3-D) parametric views and two-dimensional (2-D) polar views. The radiation characteristics are analyzed and compared to the simulations from Expert MiniNEC. Good agreement is observed
Keywords :
antenna radiation patterns; electromagnetic fields; interconnections; wire antennas; Cartesian frame; Expert MiniNEC; bent interconnect; bent wire emission; directivity estimation; expanded Hertzian dipole approach; far field; maximum E field; network model; radiation characteristics; radiation loss prediction; radiation patterns; rapid estimation; three-dimensional parametric views; two-dimensional polar views; Analytical models; Circuit simulation; Conductors; Distributed parameter circuits; Integrated circuit interconnections; Predictive models; Printed circuits; Transmission line discontinuities; Two dimensional displays; Wire; Bent interconnect; directivity; discontinuity; expanded Hertzian dipole approach; radiation loss; radiation pattern;
fLanguage :
English
Journal_Title :
Electromagnetic Compatibility, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9375
Type :
jour
DOI :
10.1109/TEMC.2006.879331
Filename :
1677781
Link To Document :
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