DocumentCode :
1159364
Title :
Crosstalk and microlens study in a color CMOS image sensor
Author :
Agranov, Gennadiy ; Berezin, Vladimir ; Tsai, Richard H.
Author_Institution :
Micron Technol. Inc., Pasadena, CA, USA
Volume :
50
Issue :
1
fYear :
2003
fDate :
1/1/2003 12:00:00 AM
Firstpage :
4
Lastpage :
11
Abstract :
The paper describes results of crosstalk investigations and microlens (μ-lens) scan experiments in a color CMOS image sensor with active pixel structure . The investigation of optical and electrical crosstalk was made on 7.8- and 5.6-μm pixels by using samples with continuous shift of color filter (CF ) and μ-lens across the array. As a result of this investigation, the distribution of sensitivity inside a pixel has been determined. By using minimum crosstalk criteria, the optimum parameters of the μ-lens manufacturing process and optimum position of the μ-lens was determined. The paper presents color maps of pixel sensitivity and crosstalk criteria as well as snapshots illustrating sensitivity distribution and collection area. The paper presents spectral characteristics measured at different relative apertures (f-number) as well. The quantitative analysis of spectral responses allowed us to determine the contribution of each component to the overall crosstalk.
Keywords :
CMOS image sensors; crosstalk; image colour analysis; microlenses; 5.6 micron; 7.8 micrometre; active pixel structure; collection area; color CMOS image sensor; continuous shift; electrical crosstalk; microlens; optical crosstalk; sensitivity; sensitivity distribution; spectral characteristics; Apertures; CMOS image sensors; Lenses; Manufacturing processes; Microoptics; Optical arrays; Optical crosstalk; Optical filters; Optical sensors; Pixel;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/TED.2002.806473
Filename :
1185156
Link To Document :
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