DocumentCode :
1159641
Title :
Ag-GaP Schottky photodiodes for UV sensors
Author :
Pikhtin, Alexander N. ; Tarasov, Sergey A. ; Kloth, Bernd
Author_Institution :
Dept. of Microelectron., St. Petersburg State Electrotech. Univ., Russia
Volume :
50
Issue :
1
fYear :
2003
fDate :
1/1/2003 12:00:00 AM
Firstpage :
215
Lastpage :
217
Abstract :
We created UV-sensitive photodiodes based on a GaP Schottky barrier. A revised value of the Ag-GaP barrier height (1.55±0.03 eV) has been determined, and this value is much larger than commonly used for this system. Moreover, it depends on the parameters of the dielectric spacer and may be up to 1.7 eV. The high Schottky barrier improves the characteristics of photodetectors. We developed two types of such photodetectors. The first one is a selective UV photodiode with λmax=0.32 μm, Δλ=15 nm, and S=0.034 A/W based on the selective transparency of silver. The second one is a broad-band with λmax=0.42 μm, Δλ=230 nm, and S=0.19 A/W.
Keywords :
III-V semiconductors; Schottky diodes; dark conductivity; gallium compounds; photodiodes; semiconductor-metal boundaries; silver; ultraviolet detectors; 0.32 micron; 0.42 micron; 1.55 to 1.7 eV; Ag-GaP; Ag-GaP Schottky photodiodes; Ag-GaP barrier height; GaP Schottky barrier; UV sensors; UV-sensitive photodiodes; broad-band photodetector; dark current; dielectric spacer parameters; narrow spectral characteristics; selective UV photodiode; selective transparency; wide spectral characteristics; Dielectrics; Epitaxial growth; Fabrication; Optical filters; Photodetectors; Photodiodes; Schottky barriers; Silicon; Silver; Sputtering;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/TED.2002.807247
Filename :
1185184
Link To Document :
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