DocumentCode :
1159704
Title :
A novel InGaP/InGaAs/GaAs double /spl delta/-doped pHEMT with camel-like gate structure
Author :
Jung-Hui Tsai
Author_Institution :
Dept. of Phys., Nat. Kaohsiung Normal Univ., Taiwan
Volume :
24
Issue :
1
fYear :
2003
Firstpage :
1
Lastpage :
3
Abstract :
The author reports a novel InGaP/InGaAs/GaAs double delta-doped pseudomorphic high-electron mobility transistor (pHEMT) with n/sup +/-GaAs/p/sup +/-InGaP/n-InGaP camel-like gate structure grown by MOCVD. Due to the p-n depletion from the p/sup +/-InGaP gate to the channel region and the presence of /spl Delta/Ec at the InGaP/InGaAs heterostructure, the turn-on voltage of gate is larger than 1.7 V. For a 1×100-μm2 device, the experimental results show an extrinsic transconductance of 107 mS/mm and a saturation current density of 850 mA/mm. Significantly, an extremely broad gate voltage swing larger than 6 V with above 80% maximum g/sub m/ is obtained. Furthermore, the unit current cut-off frequency fT and maximum oscillation frequency are up to 20 and 32 GHz, respectively. The excellent device performance provides a promise for linear and large signal amplifiers and high-frequency circuit applications.
Keywords :
III-V semiconductors; MOCVD; current density; doping profiles; gallium arsenide; gallium compounds; high electron mobility transistors; indium compounds; microwave field effect transistors; 1.7 V; 107 mS/mm; 20 GHz; 32 GHz; InGaP-InGaAs-GaAs; InGaP/InGaAs/GaAs pHEMT; MOCVD growth; broad-plateau transconductance; double /spl delta/-doped PHEMT; double delta-doped pHEMT; gate turn-on voltage; high current density; high-frequency circuit applications; large signal amplifiers; linear signal amplifiers; maximum oscillation frequency; n/sup +/-GaAs/p/sup +/-InGaP/n-InGaP camel-like gate structure; pseudomorphic HEMT; unit current cutoff frequency; Current density; Cutoff frequency; Gallium arsenide; HEMTs; Indium gallium arsenide; MOCVD; MODFETs; PHEMTs; Transconductance; Voltage;
fLanguage :
English
Journal_Title :
Electron Device Letters, IEEE
Publisher :
ieee
ISSN :
0741-3106
Type :
jour
DOI :
10.1109/LED.2002.807024
Filename :
1185191
Link To Document :
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