Title :
Probability models for pseudorandom test sequences
Author :
McCluskey, Edward J. ; Makar, Samy ; Mourad, Samiha ; Wagner, Kennth D.
Author_Institution :
Center for Reliable Comput., Stanford Univ., CA, USA
fDate :
1/1/1988 12:00:00 AM
Abstract :
A probabilistic model for pseudorandom testing of combinational circuits is presented. The expected fault coverage is shown to be accurately approximated as a series of exponentials that depends on the test length and the fault detectabilities. The derivations do not require the pattern generator to have the same number of stages as there are network inputs
Keywords :
combinatorial circuits; logic testing; probabilistic logic; probability; combinational circuits; exponentials; fault coverage; fault detectabilities; probabilistic model; pseudorandom test sequences; pseudorandom testing; test length; Circuit faults; Circuit testing; Combinational circuits; Costs; Electrical fault detection; Linear feedback shift registers; Sequential analysis; Sequential circuits; Test pattern generators; Vectors;
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
