DocumentCode :
1159798
Title :
Compact Modeling of Anomalous High-Frequency Behavior of MOSFET´s Small-Signal NQS Parameters in Presence of Velocity Saturation
Author :
Roy, Ananda S. ; Enz, Christian C. ; Sallese, Jean-Michel
Author_Institution :
Electron. Lab., Swiss Fed. Inst. of Technol., Lausanne
Volume :
53
Issue :
9
fYear :
2006
Firstpage :
2044
Lastpage :
2050
Abstract :
This paper presents a physical charge-based compact small-signal nonquasi-static (NQS) model for MOST, including velocity saturation and valid in all regions of inversion (from weak to strong inversion). This model intrinsically predicts the anomalous high-frequency behavior of transadmittance (ydg) in saturation, which was observed earlier in both device simulation and measurement. It also shows that the inclusion of velocity saturation causes the magnitude of the gate-to-drain admittance ydg to start to increase (instead of decreasing) above a certain frequency and its real part also starts to increase in the negative direction instead of becoming zero. In addition, even for a long channel MOST, the weak inversion charge present at the drain can also affect the ydg in a similar way
Keywords :
MOSFET; carrier mobility; semiconductor device models; MOSFET; anomalous high-frequency behavior; compact modeling; device measurement; device simulation; mobility degradation; small-signal nonquasi-static model; strong inversion region; velocity saturation; weak inversion region; Admittance; Bluetooth; CMOS technology; Capacitance; Degradation; Laboratories; MOSFET circuits; Predictive models; Radio frequency; Semiconductor device modeling; MOSFET compact model; Mobility degradation; nonquasi-static (NQS) effect;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/TED.2006.880226
Filename :
1677838
Link To Document :
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