Title :
Performance of Low-Dark-Current 4H-SiC Avalanche Photodiodes With Thin Multiplication Layer
Author :
Guo, Xiangyi ; Beck, Ariane L. ; Huang, Zhihong ; Duan, Ning ; Campbell, Joe C. ; Emerson, David ; Sumakeris, Joseph J.
Author_Institution :
Dept. of Electr. & Comput. Eng., Texas Univ., Austin, TX
Abstract :
The authors report on the fabrication and performance of low-dark-current 4H-SiC avalanche photodiodes with a thin 180-nm-thick p - multiplication layer. At a photocurrent gain M of 1000, the dark current of a 100-mum-diameter device was 35 pA (0.44 muA/cm2). The peak unity-gain responsivity was 100 mA/W (external quantum efficiency=46%) at lambda=268 nm, and at high gain, a responsivity greater than 107 A/W was achieved. The excess noise factor corresponds to k=0.12. Time-domain pulse measurements indicate an RC-limited unity-gain bandwidth of 300 MHz
Keywords :
avalanche photodiodes; carbon compounds; photodetectors; semiconductor technology; wide band gap semiconductors; APD; SiC; avalanche photodiodes; impact ionization; low-dark-current 4H-SiC; photodetector; thin multiplication layer; time-domain pulse measurements; Avalanche photodiodes; Dark current; Fabrication; Impact ionization; Photoconductivity; Photodetectors; Photomultipliers; Silicon carbide; Temperature sensors; Tunneling; Avalanche photodiode (APD); impact ionization; photodetector; photodiode; silicon carbide;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/TED.2006.879677