• DocumentCode
    1160038
  • Title

    Study of Laser-Debonded GaN LEDs

  • Author

    Chan, Chung-Pui ; Gao, Jie ; Yue, Tai-Man ; Surya, Charles ; Ng, Alan Man-Ching ; Djurisic, Aleksandra B. ; Liu, Peter Chow-Kee ; Li, Ming

  • Author_Institution
    Dept. of Electron. & Inf. Eng., Hong Kong Polytech. Univ.
  • Volume
    53
  • Issue
    9
  • fYear
    2006
  • Firstpage
    2266
  • Lastpage
    2272
  • Abstract
    Detailed investigations of laser-debonded GaN-based light-emitting diodes (LEDs) grown by metal-organic chemical vapor deposition (MOCVD) on sapphire substrates were reported. The debonded surface was roughened by photoelectrochemical (PEC) etching in a mixture of potassium hydroxide (KOH) and peroxydisulfate (K2S2O8 ) solution. The power for the laser-assisted debonding process has been systematically optimized. The data show that as long as the laser power does not exceed the optimal value, there is no degradation in the current-voltage (I-V) characteristics, the brightness, as well as the low-frequency noise properties of the devices. The roughness of the debonded surface is systematically varied using different etching times. Experimental results demonstrate strong dependencies of the luminous intensity of the device on the roughness of the debonded surface. A 60% improvement in the luminous intensity of the debonded and roughened LED compared to the original on-sapphire device was observed. This increase in the extraction efficiency is attributed to the reduction in the total internal reflection at the roughened GaN/air interface
  • Keywords
    III-V semiconductors; MOCVD; etching; gallium compounds; light emitting diodes; nitrogen compounds; potassium compounds; sapphire; sulphur compounds; GaN; K2S2O8; KOH; MOCVD; debonded surface roughness; hexagonal pyramid; laser de-bonding; laser-assisted debonding process; laser-debonded LED; light-emitting diodes; metal-organic chemical vapor deposition; peroxydisulfate; photoelectrochemical etching; potassium hydroxide; Chemical lasers; Chemical vapor deposition; Etching; Gallium nitride; Laser noise; Light emitting diodes; MOCVD; Power lasers; Rough surfaces; Surface roughness; Gallium nitride; hexagonal pyramid; laser debonding; light emitting diodes; low-frequency noise; roughening;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2006.881008
  • Filename
    1677863