DocumentCode :
1160221
Title :
On-Chip High- Q Variable Inductor Using Wafer-Level Chip-Scale Package Technology
Author :
Okada, Kenichi ; Sugawara, Hirotaka ; Ito, Hiroyuki ; Itoi, Kazuhisa ; Sato, Masakazu ; Abe, Hiroshi ; Ito, Tatsuya ; Masu, Kazuya
Author_Institution :
Integrated Res. Inst., Tokyo Inst. of Technol., Yokohama
Volume :
53
Issue :
9
fYear :
2006
Firstpage :
2401
Lastpage :
2406
Abstract :
In this paper, the authors propose an on-chip high-Q variable inductor embedded in wafer-level chip-scale package (WL-CSP). The variable inductor has a metal plate and a spiral inductor fabricated by the WL-CSP technology. The metal plate can be moved by a microelectromechanical systems (MEMS) actuator, and the inductance is varied according to the position of the metal plate. At the present time, the MEMS actuator has not been implemented yet. In this paper, the authors present a feasibility study on the proposed variable inductor. The inductor is evaluated with measurement results using a metal plate moved by a micromanipulator instead of the MEMS actuator. At 2 GHz, the measured inductance is varied from 4.80 to 2.27 nH, i.e., the variable ratio is 52.6%. The maximum value of quality factor is 50.1
Keywords :
chip scale packaging; eddy currents; inductors; microactuators; micromanipulators; 2 GHz; Eddy current; MEMS actuator; WL-CSP; high-Q variable inductor; metal plate; microelectromechanical systems; micromanipulator; on-chip variable inductor; wafer-level chip-scale package; Actuators; Chip scale packaging; Inductance measurement; Inductors; Microelectromechanical systems; Micromanipulators; Micromechanical devices; Q factor; Spirals; Wafer scale integration; Eddy current; high-; microelectromechanical systems (MEMS); variable inductor; wafer-level chip-scale package (WL-CSP);
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/TED.2006.880815
Filename :
1677881
Link To Document :
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