• DocumentCode
    1160477
  • Title

    Effects of molecular structure on electrical conduction in low-density polyethylene above its melting point

  • Author

    Iida, Kazumasa ; Kim, Jong Suk ; Nakamura, Shuhei ; Sawa, Goro

  • Author_Institution
    Dept. of Electr. & Electron. Eng., Mie Univ., Tsu, Japan
  • Volume
    27
  • Issue
    2
  • fYear
    1992
  • fDate
    4/1/1992 12:00:00 AM
  • Firstpage
    391
  • Lastpage
    398
  • Abstract
    The electrical conduction of various kinds of low-density polyethylene (LDPE) has been studied above the melting point. LDPEs are characterized by the amount and types of branches, double bonds, and oxygen-containing groups. Two components of conduction currents were found: one obeyed Ohm´s law in the low field range and the other was proportional to the square of the field at lower temperatures in the high field range, and was also inversely proportional to sample thickness for a constant field. The conduction mechanism of the latter component is ascribed to space charge limited current (SCLC). Among the features of the LDPE molecular structure, only the oxygen-containing groups were well correlated with the SCLC. In fact, the oxygen-containing groups reduced the SCLC, suggesting that they act as traps even in the molten state. Branches and double bonds are also known to act as traps in the solid state, but they bore no consistent relation to the electrical conduction in the molten state
  • Keywords
    electrical conductivity of liquids; electron traps; polymer melts; space-charge-limited conduction; LDPEs; Ohm´s law; SCLC; branches; conduction mechanism; double bonds; electrical conduction; low-density polyethylene; oxygen-containing groups; sample thickness; space charge limited current; traps; Amorphous materials; Crystallization; Electrodes; Helium; Morphology; Polyethylene; Polymers; Solid state circuits; Space charge; Temperature distribution;
  • fLanguage
    English
  • Journal_Title
    Electrical Insulation, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9367
  • Type

    jour

  • DOI
    10.1109/14.135610
  • Filename
    135610