Title :
Stopband-enhanced and size-miniaturized low-pass filters using high-impedance property of offset finite-ground microstrip line
Author :
Sun, Sheng ; Zhu, Lei
Author_Institution :
Sch. of Electr. & Electron. Eng., Nanyang Technol. Univ., Singapore
Abstract :
The uniform finite-ground microstrip line (FGMSL) and its constituted circuit elements are thoroughly characterized via self-calibrated method of moments for innovative design of a stopband-enhanced and size-miniaturized low-pass filter (LPF). Firstly, an offset FGMSL is modeled and extracted to quantitatively exhibit its capacity in achieving higher characteristic impedance compared to the infinite-ground microstrip line (MSL) counterpart. Secondly, the finite-extended FGMSL section with equally widened strip/ground or offset narrow strip/ground conductors is studied in terms of an equivalent T- or π-network, thereby constructing the modified MSL shunt capacitive or series inductive element. By making effective use of enlarged series inductance of an offset FGMSL with shorter electrical length, two novel LPF blocks are designed on a basis of cascaded circuit networks. Predicted S-parameters show widened and deepened stopband beyond the low passband. Furthermore, it is confirmed by measurement.
Keywords :
S-parameters; cascade networks; equivalent circuits; low-pass filters; method of moments; microstrip filters; microstrip lines; S-parameters; cascaded circuit networks; characteristic impedance; finite-ground microstrip line; high-impedance property; low-pass filters; self-calibrated method of moments; series inductive element; short-open calibration; shunt capacitive element; stopband-enhanced filter; strip/ground conductors; Circuits; Conductors; Impedance; Inductance; Low pass filters; Microstrip filters; Moment methods; Passband; Scattering parameters; Strips; Enhanced stopband; finite-ground microstrip line (FGML); high characteristic impedance; low-pass filter (LPF); method of moments (MoM); short-open calibration (SOC);
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
DOI :
10.1109/TMTT.2005.854173