Parametric fault diagnosis in analog circuit using genetic algorithm

Author

Karthi, S.P. ; Shanthi, M. ; Bhuvaneswari, M.C.

Author_Institution

Electron. & Commun. Eng., Kumaraguru Coll. of Technol., Coimbatore, India

fYear

2014

fDate

6-8 March 2014

Firstpage

1

Lastpage

5

Abstract

This paper presents a new method for diagnosis of parametric faults in analog circuits based on the transfer function of the Circuit Under Test (CUT). Genetic algorithm is used to optimize the system parameters defined in the chromosome. In this method, every system parameter is composed of several components. Components are grouped into suitable modules. Then, genetic algorithm is used to design the filter using system parameters and also to diagnose the fault and it locates the module level fault. The CUT used is Sallen-key band pass filter.

Keywords

analogue circuits; band-pass filters; circuit testing; fault diagnosis; genetic algorithms; transfer functions; CUT; Sallen-key band pass filter; analog circuits; circuit under test; genetic algorithm; parametric fault diagnosis; transfer function; Analog circuits; Biological cells; Circuit faults; Fault diagnosis; Genetic algorithms; Sociology; Transfer functions; Analog circuit; Genetic algorithm; Parametric fault; sallen-key filter;

fLanguage

English

Publisher

ieee

Conference_Titel

Green Computing Communication and Electrical Engineering (ICGCCEE), 2014 International Conference on

Conference_Location

Coimbatore

Type

conf

DOI

10.1109/ICGCCEE.2014.6921410

Filename

6921410