Title :
Detection of stuck-at and bridging faults in Reed-Muller canonical (RMC) networks
Author :
Damaria, T. ; Karpovsky, M.
Author_Institution :
Dept. of Electr. Eng., Kentucky Univ., Lexington, KY, USA
fDate :
9/1/1989 12:00:00 AM
Abstract :
Boolean function realisations by Reed-Muller networks have many desirable properties in terms of testability. In the paper it is shown that there exists a single set of test patterns which would detect all single stuck-at and all single bridging (short-circuit) faults in Reed-Muller networks, and the number of test patterns is shown to be at most 3n+5, where n is the number of input variables in the function. In the case of networks with k outputs, where kn, the number of test patterns required to detect all single stuck-at and all single detectable bridging faults (both AND and OR) is also shown to be 3n+5.
Keywords :
combinatorial circuits; fault location; logic testing; Boolean functions; Reed-Muller canonical networks; bridging faults; stuck-at faults detection; test patterns;
Journal_Title :
Computers and Digital Techniques, IEE Proceedings E