• DocumentCode
    1161104
  • Title

    Detection of stuck-at and bridging faults in Reed-Muller canonical (RMC) networks

  • Author

    Damaria, T. ; Karpovsky, M.

  • Author_Institution
    Dept. of Electr. Eng., Kentucky Univ., Lexington, KY, USA
  • Volume
    136
  • Issue
    5
  • fYear
    1989
  • fDate
    9/1/1989 12:00:00 AM
  • Firstpage
    430
  • Lastpage
    433
  • Abstract
    Boolean function realisations by Reed-Muller networks have many desirable properties in terms of testability. In the paper it is shown that there exists a single set of test patterns which would detect all single stuck-at and all single bridging (short-circuit) faults in Reed-Muller networks, and the number of test patterns is shown to be at most 3n+5, where n is the number of input variables in the function. In the case of networks with k outputs, where kn, the number of test patterns required to detect all single stuck-at and all single detectable bridging faults (both AND and OR) is also shown to be 3n+5.
  • Keywords
    combinatorial circuits; fault location; logic testing; Boolean functions; Reed-Muller canonical networks; bridging faults; stuck-at faults detection; test patterns;
  • fLanguage
    English
  • Journal_Title
    Computers and Digital Techniques, IEE Proceedings E
  • Publisher
    iet
  • ISSN
    0143-7062
  • Type

    jour

  • Filename
    31396