SOCRATES: a highly efficient automatic test pattern generation system

Author

Schulz, Michael H. ; Trischler, Erwin ; Sarfert, Thomas M.

Author_Institution

Inst. of Comput. Aided Design, Tech. Univ. of Munich, West Germany

Volume

7

Issue

1

fYear

1988

fDate

1/1/1988 12:00:00 AM

Firstpage

126

Lastpage

137

Abstract

An automatic test pattern generation system, SOCRATES, is presented. SOCRATES includes several novel concepts and techniques that significantly improve and accelerate the automatic test pattern generation process for combinational and scan-based circuits. Based on the FAN algorithm, improved implication, sensitization, and multiple backtrace procedures are described. The application of these techniques leads to a considerable reduction of the number of backtrackings and an earlier recognition of conflicts and redundancies. Several experiments using a set of combinational benchmark circuits demonstrate the efficiency of SOCRATES and its cost-effectiveness, even in a workstation environment

Keywords

automatic testing; combinatorial circuits; logic testing; FAN algorithm; SOCRATES; automatic test pattern generation system; backtrackings; combinational benchmark circuits; conflicts; implication; multiple backtrace; redundancies; scan-based circuits; sensitization; Automatic test pattern generation; Automatic testing; Benchmark testing; Circuit faults; Circuit testing; Costs; Design for testability; Test pattern generators; Very large scale integration; Workstations;

fLanguage

English

Journal_Title

Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on

Publisher

ieee

ISSN

0278-0070

Type

jour

DOI

10.1109/43.3140

Filename

3140