• DocumentCode
    1161630
  • Title

    Volumetric limits of planar integrated resonant transformers: a 1 MHz case study

  • Author

    Strydom, Johan Tjeerd ; Van Wyk, Jacobus Daniel

  • Author_Institution
    Bradley Dept. of Electr. & Comput. Eng., Virginia Polytech Inst. & State Univ., Blacksburg, VA, USA
  • Volume
    18
  • Issue
    1
  • fYear
    2003
  • fDate
    1/1/2003 12:00:00 AM
  • Firstpage
    236
  • Lastpage
    247
  • Abstract
    The integrated planar resonant/transformer structures analyzed are constructed from planar ferrites, conductive layers, leakage layers and ceramic dielectric substrates. The minimum dimensions for these electromagnetically integrated structures are determined based on electromagnetic and technological limits respectively. Thus to answer the question as to what is the minimum required volume that can be theoretically achieved, the electromagnetic material limits are analyzed. These material limits are expressed in terms of the permeabilities, permittivities and conductivities, skin effect and breakdown field of the different materials. A design based solely on these electromagnetic limits is developed and compared to the present constructional limitations. This is conducted for an example of a particular integrated resonant/transformer structure, the L-L-C-T, to illustrate the analysis. This analysis indicates that design based on the electromagnetic limits results in volumes two orders of magnitude smaller than the present prototypes, illustrating that the power density is at present only limited by constructional technology. The thermal limit, however, is expected to be the next barrier within one order of magnitude.
  • Keywords
    capacitance; electrical conductivity; inductance; magnetic permeability; permittivity; skin effect; transformers; 1 MHz; breakdown field; ceramic dielectric substrates; conductive layers; conductivities; constructional technology; electromagnetic limits; electromagnetic material limits; electromagnetically integrated structures; integrated capacitance-inductance; leakage layers; losses estimation; minimum dimensions; passive integration; permeabilities; permittivities; planar ferrites; planar integrated resonant transformers; power density; skin effect; technological limits; volumetric limits; Ceramics; Conducting materials; Dielectric materials; Dielectric substrates; Electromagnetic analysis; Ferrites; Permeability; Permittivity; Resonance; Transformers;
  • fLanguage
    English
  • Journal_Title
    Power Electronics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0885-8993
  • Type

    jour

  • DOI
    10.1109/TPEL.2002.807191
  • Filename
    1187343