DocumentCode
1162038
Title
Test-pattern-reduced decoding for turbo product codes with multi-error-correcting eBCH codes
Author
Chen, Guo Tai ; Cao, Lei ; Yu, Lun ; Chen, Chang Wen
Author_Institution
Fuzhou Univ., Fuzhou
Volume
57
Issue
2
fYear
2009
fDate
2/1/2009 12:00:00 AM
Firstpage
307
Lastpage
310
Abstract
We present a method to reduce the number of test patterns (TPs) decoded in the Chase-II algorithm for turbo product codes (TPCs) constructed with multi-error-correcting extended Bose-Chaudhuri-Hocquengem (eBCH) codes. We classify TPs into different conditions based on the relationship between syndromes and the number of errors so that TPs with the same codeword are not decoded except the one with the least number of errors. For eBCH with code length of 64, simulation results show that over 50% of TPs need not to be decoded without any performance degradation.
Keywords
BCH codes; decoding; error correction codes; turbo codes; extended Bose-Chaudhuri-Hocquengem codes; multierror-correcting eBCH codes; test-pattern-reduced decoding; turbo product codes; Communications Society; Convolutional codes; Decoding; Degradation; Error correction codes; Physics; Product codes; Redundancy; Testing; Turbo codes; Chase-II algorithm, extended BCH codes, test patterns, turbo product codes.;
fLanguage
English
Journal_Title
Communications, IEEE Transactions on
Publisher
ieee
ISSN
0090-6778
Type
jour
DOI
10.1109/TCOMM.2009.02.0603752
Filename
4784334
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