• DocumentCode
    1162038
  • Title

    Test-pattern-reduced decoding for turbo product codes with multi-error-correcting eBCH codes

  • Author

    Chen, Guo Tai ; Cao, Lei ; Yu, Lun ; Chen, Chang Wen

  • Author_Institution
    Fuzhou Univ., Fuzhou
  • Volume
    57
  • Issue
    2
  • fYear
    2009
  • fDate
    2/1/2009 12:00:00 AM
  • Firstpage
    307
  • Lastpage
    310
  • Abstract
    We present a method to reduce the number of test patterns (TPs) decoded in the Chase-II algorithm for turbo product codes (TPCs) constructed with multi-error-correcting extended Bose-Chaudhuri-Hocquengem (eBCH) codes. We classify TPs into different conditions based on the relationship between syndromes and the number of errors so that TPs with the same codeword are not decoded except the one with the least number of errors. For eBCH with code length of 64, simulation results show that over 50% of TPs need not to be decoded without any performance degradation.
  • Keywords
    BCH codes; decoding; error correction codes; turbo codes; extended Bose-Chaudhuri-Hocquengem codes; multierror-correcting eBCH codes; test-pattern-reduced decoding; turbo product codes; Communications Society; Convolutional codes; Decoding; Degradation; Error correction codes; Physics; Product codes; Redundancy; Testing; Turbo codes; Chase-II algorithm, extended BCH codes, test patterns, turbo product codes.;
  • fLanguage
    English
  • Journal_Title
    Communications, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0090-6778
  • Type

    jour

  • DOI
    10.1109/TCOMM.2009.02.0603752
  • Filename
    4784334