DocumentCode :
1162337
Title :
ESD phenomena in GMR heads in the manufacturing process of HDD and GMR heads
Author :
Matsugi, Junya ; Mizoh, Yoshiaki ; Nakano, Taro ; Nakamura, Kazuo ; Sakakima, Hiroshi
Author_Institution :
Matsushita-Kotobuki Electron. Ind. Ltd., Ehime, Japan
Volume :
28
Issue :
3
fYear :
2005
fDate :
7/1/2005 12:00:00 AM
Firstpage :
206
Lastpage :
212
Abstract :
It is well known that giant magnetoresistive (GMR) heads used for hard disk drives (HDD) are very sensitive to electrostatic discharge (ESD). In this paper, we describe a method of categorizing ESD damage modes from a standpoint of magnetic influences on the heads as observed by quasi-static test (QST) characteristics as well as electromagnetic characteristics like off-track profiles. In addition, we report an example of GMR stack interlayer diffusion which is one type of hard ESD damage. We also present an example of ESD damage that happened in an actual production process and its preventive measures as guidelines.
Keywords :
electrostatic discharge; failure analysis; giant magnetoresistance; hard discs; magnetic heads; manufacturing processes; quality control; ESD damage modes; GMR head; GMR heads; GMR stack inter-layer diffusion; HDD; QST; electrostatic discharge; giant magnetoresistive heads; hard ESD damage; hard disk drives; manufacturing process; off-track profiles; production process; quasi-static test; Ballistic magnetoresistance; Colossal magnetoresistance; Electrostatic discharge; Extraordinary magnetoresistance; Giant magnetoresistance; Hard disks; Magnetic heads; Manufacturing processes; Testing; Tunneling magnetoresistance;
fLanguage :
English
Journal_Title :
Electronics Packaging Manufacturing, IEEE Transactions on
Publisher :
ieee
ISSN :
1521-334X
Type :
jour
DOI :
10.1109/TEPM.2005.854299
Filename :
1506867
Link To Document :
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