Combined TLP/RF testing system for detection of ESD failures in RF circuits

Author

Hyvonen, Sami ; Joshi, Sopan ; Rosenbaum, Elyze

Author_Institution

Intel Corp., Hillsboro, OR, USA

Volume

28

Issue

3

fYear

2005

fDate

7/1/2005 12:00:00 AM

Firstpage

224

Lastpage

230

Abstract

We present a modified transmission-line pulse (TLP) measurement system in which radio frequency (RF) functionality tests, along with the conventional leakage current measurement, are performed after each pulse to detect failure. Measurement results from 5-GHz low-noise amplifiers (LNAs) show that RF metrics degrade before the leakage current increases. Also, we introduce an electrostatic discharge (ESD)-protected RF circuit for which leakage current measurements cannot be made, necessitating the use of other failure criteria.

Keywords

electrostatic discharge; failure analysis; integrated circuit testing; leakage currents; measurement systems; microwave amplifiers; microwave measurement; pulse measurement; radiofrequency integrated circuits; transmission lines; 5 GHz; ESD failures detection; LNA; RF circuits; RF metrics; TLP; electrostatic discharge; leakage current measurement; low-noise amplifiers; radio frequency functionality tests; testing system; transmission-line pulse measurement system; Circuit testing; Current measurement; Electrostatic discharge; Electrostatic measurements; Frequency measurement; Leakage current; Pulse amplifiers; Pulse measurements; Radio frequency; System testing; Electrostatic discharge (ESD) measurement; low-noise amplifier (LNA); radio frequency (RF) circuits; transmission line pulse (TLP);

fLanguage

English

Journal_Title

Electronics Packaging Manufacturing, IEEE Transactions on

Publisher

ieee

ISSN

1521-334X

Type

jour

DOI

10.1109/TEPM.2005.854142

Filename

1506869