DocumentCode :
1162912
Title :
Analysis of capacitance ratio of a rectangular X-cut length-extensional mode quartz crystal resonator by stresses
Author :
Yokoyama, Yoshisato ; Kawashima, Hitoshi ; Kanie, Hisashi
Author_Institution :
Tokyo Univ. of Sci., Chiba
Volume :
53
Issue :
9
fYear :
2006
Firstpage :
1551
Lastpage :
1553
Abstract :
The electrical properties of an X-cut, length-extensional mode quartz crystal resonator of a cut angle thetas around the X-axis were calculated by a variational method using stresses as trial functions. Analytical expressions of stresses were estimated by a linear regression on a cut angle best-fit to the results of finite-element method. The calculated dependence of the capacitance ratio on the cut angle was consistent with the measured results
Keywords :
capacitance; crystal resonators; finite element analysis; stress analysis; variational techniques; SiO2; capacitance ratio; cut angle; finite-element method; linear regression; rectangular X-cut length-extensional mode quartz crystal resonator; stresses; variational method; Boundary conditions; Capacitance measurement; Electric variables; Electrodes; Equations; Finite element methods; Frequency; Linear regression; Stress; Temperature distribution;
fLanguage :
English
Journal_Title :
Ultrasonics, Ferroelectrics, and Frequency Control, IEEE Transactions on
Publisher :
ieee
ISSN :
0885-3010
Type :
jour
DOI :
10.1109/TUFFC.2006.1678179
Filename :
1678179
Link To Document :
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