• DocumentCode
    1162912
  • Title

    Analysis of capacitance ratio of a rectangular X-cut length-extensional mode quartz crystal resonator by stresses

  • Author

    Yokoyama, Yoshisato ; Kawashima, Hitoshi ; Kanie, Hisashi

  • Author_Institution
    Tokyo Univ. of Sci., Chiba
  • Volume
    53
  • Issue
    9
  • fYear
    2006
  • Firstpage
    1551
  • Lastpage
    1553
  • Abstract
    The electrical properties of an X-cut, length-extensional mode quartz crystal resonator of a cut angle thetas around the X-axis were calculated by a variational method using stresses as trial functions. Analytical expressions of stresses were estimated by a linear regression on a cut angle best-fit to the results of finite-element method. The calculated dependence of the capacitance ratio on the cut angle was consistent with the measured results
  • Keywords
    capacitance; crystal resonators; finite element analysis; stress analysis; variational techniques; SiO2; capacitance ratio; cut angle; finite-element method; linear regression; rectangular X-cut length-extensional mode quartz crystal resonator; stresses; variational method; Boundary conditions; Capacitance measurement; Electric variables; Electrodes; Equations; Finite element methods; Frequency; Linear regression; Stress; Temperature distribution;
  • fLanguage
    English
  • Journal_Title
    Ultrasonics, Ferroelectrics, and Frequency Control, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0885-3010
  • Type

    jour

  • DOI
    10.1109/TUFFC.2006.1678179
  • Filename
    1678179