• DocumentCode
    1163128
  • Title

    Test data compression

  • Author

    McCluskey, E.J. ; Burek, D. ; Koenemann, B. ; Mitra, Subhasish ; Patel, Jatin ; Rajski, J. ; Waicukauski, J.

  • Author_Institution
    Stanford University
  • Volume
    20
  • Issue
    2
  • fYear
    2003
  • Firstpage
    76
  • Lastpage
    87
  • Keywords
    Automatic test pattern generation; Built-in self-test; Circuit faults; Costs; Decoding; Electronics industry; Information theory; Semiconductor device manufacture; Test data compression; Testing;
  • fLanguage
    English
  • Journal_Title
    Design & Test of Computers, IEEE
  • Publisher
    ieee
  • ISSN
    0740-7475
  • Type

    jour

  • DOI
    10.1109/MDT.2003.1188267
  • Filename
    1188267
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1163128