DocumentCode :
1163128
Title :
Test data compression
Author :
McCluskey, E.J. ; Burek, D. ; Koenemann, B. ; Mitra, Subhasish ; Patel, Jatin ; Rajski, J. ; Waicukauski, J.
Author_Institution :
Stanford University
Volume :
20
Issue :
2
fYear :
2003
Firstpage :
76
Lastpage :
87
Keywords :
Automatic test pattern generation; Built-in self-test; Circuit faults; Costs; Decoding; Electronics industry; Information theory; Semiconductor device manufacture; Test data compression; Testing;
fLanguage :
English
Journal_Title :
Design & Test of Computers, IEEE
Publisher :
ieee
ISSN :
0740-7475
Type :
jour
DOI :
10.1109/MDT.2003.1188267
Filename :
1188267
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1163128
