• DocumentCode
    1163196
  • Title

    Electrical treeing characteristics in XLPE power cable insulation in frequency range between 20 and 500 Hz

  • Author

    Chen, G. ; Tham, C.H.

  • Author_Institution
    Sch. of Electron. & Comput. Sci., Univ. of Southampton, Southampton
  • Volume
    16
  • Issue
    1
  • fYear
    2009
  • fDate
    2/1/2009 12:00:00 AM
  • Firstpage
    179
  • Lastpage
    188
  • Abstract
    Electrical treeing is one of the main reasons for long term degradation of polymeric materials used in high voltage AC applications. In this paper we report on an investigation of electrical tree growth characteristics in XLPE samples from a commercial XLPE power cable. Electrical trees have been grown over a frequency range from 20 Hz to 500 Hz and images of trees were taken using CCD camera without interrupting the application of voltage. The fractal dimension of electric tree is obtained using a simple box-counting technique. Contrary to our expectation it has been found that the fractal dimension prior to the breakdown shows no significant change when frequency of the applied voltage increases. Instead, the frequency accelerates tree growth rate and reduces the time to breakdown. A new approach for investigating the frequency effect on trees has been devised. In addition to looking into the fractal analysis of tree as a whole, regions of growth are being sectioned to reveal differences in terms of growth rate, accumulated damage and fractal dimension.
  • Keywords
    CCD image sensors; XLPE insulation; power cable insulation; trees (electrical); CCD camera; XLPE power cable insulation; electrical treeing characteristics; fractal dimension analysis; frequency 20 Hz to 500 Hz; high voltage AC applications; polymeric material degradation; simple box-counting technique; Breakdown voltage; Charge coupled devices; Charge-coupled image sensors; Fractals; Frequency; Polymers; Power cable insulation; Power cables; Thermal degradation; Trees - insulation; Electrical tree, fractal dimension, box-counting, variable frequency, growth rate, accumulated damage, partial discharge.;
  • fLanguage
    English
  • Journal_Title
    Dielectrics and Electrical Insulation, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1070-9878
  • Type

    jour

  • DOI
    10.1109/TDEI.2009.4784566
  • Filename
    4784566