• DocumentCode
    1163663
  • Title

    Improvement of On–Off-Current Ratio in  \\hbox {TiO}_{\\rm x} Active-Channel TFTs Using \\hbox {N</h1></div></div>
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            <div class='row g-0 align-items-center mb-2'><div class='col-12 col-md-3 fullRecLabelEnglish fw-bold mb-2 mb-md-0'><span class='text-muted small'>Author</span></div><div class='col-12 col-md-9 leftDirection leftAlign'><h2 class='mb-0 fw-semibold'>Park, Jae-Woo ; Lee, Dongyun ; Kwon, Hakyoung ; Yoo, Seunghyup</h2></div></div>
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            <div class='row g-0 align-items-center mb-2'><div class='col-12 col-md-3 fullRecLabelEnglish fw-bold mb-2 mb-md-0'><span class='text-muted small'>Author_Institution</span></div><div class='col-12 col-md-9 leftDirection leftAlign'>Sch. of Electr. Eng. & Comput. Sci., Korea Adv. Inst. of Sci. & Technol., Daejeon</div></div>
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            <div class='row g-0 align-items-center mb-2'><div class='col-12 col-md-3 fullRecLabelEnglish fw-bold mb-2 mb-md-0'><span class='text-muted small'>Volume</span></div><div class='col-12 col-md-9 leftDirection leftAlign'>30</div></div>
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            <div class='row g-0 align-items-center mb-2'><div class='col-12 col-md-3 fullRecLabelEnglish fw-bold mb-2 mb-md-0'><span class='text-muted small'>Issue</span></div><div class='col-12 col-md-9 leftDirection leftAlign'>4</div></div>
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            <div class='row g-0 align-items-center mb-2'><div class='col-12 col-md-3 fullRecLabelEnglish fw-bold mb-2 mb-md-0'><span class='text-muted small'>fYear</span></div><div class='col-12 col-md-9 leftDirection leftAlign'>2009</div></div>
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            <div class='row g-0 align-items-center mb-2'><div class='col-12 col-md-3 fullRecLabelEnglish fw-bold mb-2 mb-md-0'><span class='text-muted small'>fDate</span></div><div class='col-12 col-md-9 leftDirection leftAlign'>4/1/2009 12:00:00 AM</div></div>
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            <div class='row g-0 align-items-center mb-2'><div class='col-12 col-md-3 fullRecLabelEnglish fw-bold mb-2 mb-md-0'><span class='text-muted small'>Firstpage</span></div><div class='col-12 col-md-9 leftDirection leftAlign'>362</div></div>
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            <div class='row g-0 align-items-center mb-2'><div class='col-12 col-md-3 fullRecLabelEnglish fw-bold mb-2 mb-md-0'><span class='text-muted small'>Lastpage</span></div><div class='col-12 col-md-9 leftDirection leftAlign'>364</div></div>
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            <div class='row g-0 align-items-center mb-2'><div class='col-12 col-md-3 fullRecLabelEnglish fw-bold mb-2 mb-md-0'><span class='text-muted small'>Abstract</span></div><div class='col-12 col-md-9 leftDirection leftAlign'>Without sacrificing the on-current in the transfer characteristics, we have successfully reduced the off-current part by the optimal N<sub>2</sub>O plasma treatment to improve the on-off-current ratio in n-type titanium oxide ( TiO<sub>x</sub>) active-channel thin-film transistors. While the high-power (275 W) N<sub>2</sub>O plasma treatment oxidizes the whole TiO<sub>x</sub> channel and results in the reduction of both on- and off-current, the optimized low-power (150 W) process makes the selective oxidation of the top portion in the channel and reduces only the off-current significantly. Increase in on-off ratio by almost five orders of magnitude is achieved without change in on-current by using the presented method.</div></div>
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            <div class='row g-0 align-items-center mb-2'><div class='col-12 col-md-3 fullRecLabelEnglish fw-bold mb-2 mb-md-0'><span class='text-muted small'>Keywords</span></div><div class='col-12 col-md-9 leftDirection leftAlign'>nitrogen compounds; plasma applications; thin film transistors; titanium compounds; N<sub>2</sub>O; TiO<sub>x</sub>; active-channel thin-film transistors; on-off-current ratio; optimized low-power process; plasma treatment; power 150 W; <formula formulatype=$hbox{N}_{2}hbox{O}$ plasma treatment; on–off-current ratio; plasma-enhanced atomic-layer deposition (PEALD); thin-film transistor (TFT); titanium oxide $( hbox{TiO}_{rm x})$;

  • fLanguage
    English
  • Journal_Title
    Electron Device Letters, IEEE
  • Publisher
    ieee
  • ISSN
    0741-3106
  • Type

    jour

  • DOI
    10.1109/LED.2009.2013647
  • Filename
    4785133