Title :
An Algorithm for Testing the Planarity of a Graph
Author :
Dunn, W. ; Chan, Shing-Chow
fDate :
6/1/1968 12:00:00 AM
Keywords :
Graph planarity; Planar networks; Automatic testing; Circuit testing; Circuit theory; Integrated circuit synthesis; Integrated circuit testing; Transmission line matrix methods;
Journal_Title :
Circuit Theory, IEEE Transactions on
DOI :
10.1109/TCT.1968.1082800