DocumentCode :
1164425
Title :
IOC-LP: hybrid test data compression/ decompression scheme for low power testing
Author :
Chun, Se Young ; Kim, Youngjae ; Yang, Ming-Hsuan ; Kang, Sook-Yang
Volume :
153
Issue :
4
fYear :
2006
fDate :
8/1/2006 12:00:00 AM
Firstpage :
391
Lastpage :
398
fLanguage :
English
Journal_Title :
Circuits, Devices and Systems, IEE Proceedings
Publisher :
iet
ISSN :
1350-2409
Type :
jour
Filename :
1681683
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1164425
