DocumentCode
1164475
Title
Design and Implementation of Cost-Effective Probabilistic-Based Noise-Tolerant VLSI Circuits
Author
Wey, I-Chyn ; Chen, You-Gang ; Yu, Chang-Hong ; An-Yeu Wu ; Chen, Jie
Author_Institution
Dept. of Electr. Eng., Chang Gung Univ., Taoyuan, Taiwan
Volume
56
Issue
11
fYear
2009
Firstpage
2411
Lastpage
2424
Abstract
As the size of CMOS devices is scaled down to nanometers, noise can significantly affect circuit performance. Because noise is random and dynamic in nature, a probabilistic-based approach is better suited to handle these types of errors compared with conventional CMOS designs. In this paper, we propose a cost-effective probabilistic-based noise-tolerant circuit-design methodology. Our cost-effective method is based on master-and-slave Markov random field (MRF) mapping and master-and-slave MRF logic-gate construction. The resulting probabilistic-based MRF circuit trades hardware cost for circuit reliability. To demonstrate a noise-tolerant performance, an 8-bit MRF carry-lookahead adder (MRF_CLA) was implemented using the 0.13-mum CMOS process technology. The chip measurement results show that the proposed master-and-slave MRF_CLA can provide a 7.00 times 10-5 bit-error rate (BER) under 10.6-dB signal-to-noise ratio, while the conventional CMOS_CLA can only provide 8.84 times 10-3 BER. Because of high noise immunity, the master-and-slave MRF_CLA can operate under 0.25 V to tolerate noise interference with only 1.9 muW/MHz of energy consumption. Moreover, the transistor count can be reduced by 42% as compared with the direct-mapping MRF_CLA design .
Keywords
CMOS logic circuits; Markov processes; VLSI; adders; error statistics; integrated circuit design; integrated circuit noise; integrated circuit reliability; logic gates; low-power electronics; random processes; CMOS devices; bit-error rate; carry-lookahead adder; circuit reliability; circuit-design methodology; energy consumption; master-and-slave MRF logic-gate construction; master-and-slave Markov random field mapping; noise interference; noise-tolerant performance; probabilistic-based noise-tolerant VLSI circuits; signal-to-noise ratio; size 0.13 mum; voltage 0.25 V; Cost-effective hardware design; Markov random field (MRF); master-and-slave MRF mapping; noise-tolerant circuit; probabilistically based circuit;
fLanguage
English
Journal_Title
Circuits and Systems I: Regular Papers, IEEE Transactions on
Publisher
ieee
ISSN
1549-8328
Type
jour
DOI
10.1109/TCSI.2009.2015648
Filename
4785218
Link To Document