Title :
Design and Implementation of Cost-Effective Probabilistic-Based Noise-Tolerant VLSI Circuits
Author :
Wey, I-Chyn ; Chen, You-Gang ; Yu, Chang-Hong ; An-Yeu Wu ; Chen, Jie
Author_Institution :
Dept. of Electr. Eng., Chang Gung Univ., Taoyuan, Taiwan
Abstract :
As the size of CMOS devices is scaled down to nanometers, noise can significantly affect circuit performance. Because noise is random and dynamic in nature, a probabilistic-based approach is better suited to handle these types of errors compared with conventional CMOS designs. In this paper, we propose a cost-effective probabilistic-based noise-tolerant circuit-design methodology. Our cost-effective method is based on master-and-slave Markov random field (MRF) mapping and master-and-slave MRF logic-gate construction. The resulting probabilistic-based MRF circuit trades hardware cost for circuit reliability. To demonstrate a noise-tolerant performance, an 8-bit MRF carry-lookahead adder (MRF_CLA) was implemented using the 0.13-mum CMOS process technology. The chip measurement results show that the proposed master-and-slave MRF_CLA can provide a 7.00 times 10-5 bit-error rate (BER) under 10.6-dB signal-to-noise ratio, while the conventional CMOS_CLA can only provide 8.84 times 10-3 BER. Because of high noise immunity, the master-and-slave MRF_CLA can operate under 0.25 V to tolerate noise interference with only 1.9 muW/MHz of energy consumption. Moreover, the transistor count can be reduced by 42% as compared with the direct-mapping MRF_CLA design .
Keywords :
CMOS logic circuits; Markov processes; VLSI; adders; error statistics; integrated circuit design; integrated circuit noise; integrated circuit reliability; logic gates; low-power electronics; random processes; CMOS devices; bit-error rate; carry-lookahead adder; circuit reliability; circuit-design methodology; energy consumption; master-and-slave MRF logic-gate construction; master-and-slave Markov random field mapping; noise interference; noise-tolerant performance; probabilistic-based noise-tolerant VLSI circuits; signal-to-noise ratio; size 0.13 mum; voltage 0.25 V; Cost-effective hardware design; Markov random field (MRF); master-and-slave MRF mapping; noise-tolerant circuit; probabilistically based circuit;
Journal_Title :
Circuits and Systems I: Regular Papers, IEEE Transactions on
DOI :
10.1109/TCSI.2009.2015648