Title :
High-resolution measurement of planar waveguide birefringence using ring resonator
Author :
Liu, J. ; Lu, Z. ; Zhang, Z. ; Xiao, G. ; Sun, F.
Author_Institution :
Inst. for Microstruct. Sci., Nat. Res. Council of Canada, Ont., Canada
fDate :
7/20/2006 12:00:00 AM
Abstract :
Birefringence measurement of planar silica-on-silicon waveguides with high resolution is proposed and demonstrated using a ring resonator. For the presented waveguide sample, the measured birefringence at 1550 nm was (4.115±0.094)×10-6 at 25.000±0.001°C. The minimum low-level birefringence resolution of 6.266×10-7 was experimentally realised.
Keywords :
birefringence; optical planar waveguides; optical resonators; 1550 nm; Si; birefringence measurement; planar waveguide; ring resonator; silica-on-silicon waveguide;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:20061327
