DocumentCode
1165040
Title
First Demonstration of Coexistence of Standard Gigabit TDM-PON and Code Division Multiplexed PON Architectures Toward Next Generation Access Network
Author
Tamai, Hideaki ; Sarashina, Masahiro ; Iwamura, Hideyuki ; Kashima, Masayuki ; Gupta, Gyaneshwar C. ; Ushikubo, Takashi ; Kamijoh, Takeshi ; Chanclou, Philippe ; Genay, Naveena ; Landousies, Bernard ; Mosek, Andrzej ; Gredziak, Michal
Author_Institution
Corp. R&D Center, Oki Electr. Ind. Co., Ltd., Tokyo
Volume
27
Issue
3
fYear
2009
Firstpage
292
Lastpage
298
Abstract
World-first coexistence trial of TDM and CDM giga-bit passive optical networks (PONs) was successfully completed. A very shallow minimum isolation of 7 dB between G- and CDM-PON at OLT and ONU in the ITU-T G.984.5 enhancement band was demonstrated. The feasibility of bidirectional transmission on the same wavelength was confirmed. The backscattering optical noise does not seriously affect the maximum reach of CDM-PON. Adding the CDM-PON onto GPON can provide following technical and economical impacts: low-cost coexistence, minimum service outage, and combination of best-effort and guaranteed-bandwidth for efficient and high-quality network services due to CDM feature.
Keywords
Rayleigh scattering; code division multiple access; optical fibre subscriber loops; optical noise; time division multiplexing; ITU-T G.984.5 enhancement band; OLT; ONU; Rayleigh backscattering; access network; bidirectional transmission; code division multiplexed PON; gigabit TDM-PON; optical line terminal; optical network unit; optical noise; passive optical networks; time division multiplexing; Backscatter; Code division multiplexing; Code standards; Next generation networking; Optical fiber networks; Passive optical networks; Research and development; Time division multiplexing; WDM networks; Wavelength division multiplexing; Code division multiplexing; Rayleigh backscattering; coexisting network; passive optical network;
fLanguage
English
Journal_Title
Lightwave Technology, Journal of
Publisher
ieee
ISSN
0733-8724
Type
jour
DOI
10.1109/JLT.2008.2009999
Filename
4785280
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