مرکز منطقه ای اطلاع رساني علوم و فناوري - Call for Papers: Special Issue on IR-Drop and Power Supply Noise Effects on Design and Test of Very Deep-Submicron Designs

DocumentCode :

1165182

Title :

Call for Papers: Special Issue on IR-Drop and Power Supply Noise Effects on Design and Test of Very Deep-Submicron Designs

Volume :

Issue :

fYear :

2006

fDate :

4/1/2006 12:00:00 AM

Firstpage :

267

Lastpage :

267

Abstract :

Prospective authors are requested to submit new, unpublished manuscripts for inclusion in the upcoming event described in this call for papers.

fLanguage :

English

Journal_Title :

Design & Test of Computers, IEEE

Publisher :

ieee

ISSN :

0740-7475

Type :

jour

DOI :

10.1109/MDT.2006.89

Filename :

1683712

Link To Document :