• DocumentCode
    1165201
  • Title

    Gate turn-off capability of depletion-mode thyristors

  • Author

    Baliga, B.Jayant ; Chang, Hsueh-Rong

  • Author_Institution
    GE Co., Schenectady, NY, USA
  • Volume
    10
  • Issue
    10
  • fYear
    1989
  • Firstpage
    464
  • Lastpage
    466
  • Abstract
    Experimental results are described which demonstrate the ability to switch a thyristor from its ON state to its OFF state by using a depletion layer formed by the application of gate bias to a trench-gate MOSFET integrated within the thyristor structure. The maximum controllable current is found to be a function of the gate bias voltage, the trench depth, and the ambient temperature. The maximum controllable current can be increased by increasing the trench depth and decreasing the p-base sheet resistance. The maximum controllable current decreases at high temperatures, as in the case of other MOS-bipolar devices, but is significantly better than for previous devices. The absolute values of the maximum turnoff current are well above 1000 A/cm/sup 2/ at room temperature and 500 A/cm/sup 2/ at 200 degrees C.<>
  • Keywords
    insulated gate field effect transistors; thyristors; 200 degC; ambient temperature; depletion-mode thyristors; gate bias; gate bias voltage; maximum controllable current; maximum turnoff current; p-base sheet resistance; trench depth; trench-gate MOSFET; MOSFET circuits; Switches; Temperature control; Thyristors; Voltage control;
  • fLanguage
    English
  • Journal_Title
    Electron Device Letters, IEEE
  • Publisher
    ieee
  • ISSN
    0741-3106
  • Type

    jour

  • DOI
    10.1109/55.43101
  • Filename
    43101