DocumentCode :
1165201
Title :
Gate turn-off capability of depletion-mode thyristors
Author :
Baliga, B.Jayant ; Chang, Hsueh-Rong
Author_Institution :
GE Co., Schenectady, NY, USA
Volume :
10
Issue :
10
fYear :
1989
Firstpage :
464
Lastpage :
466
Abstract :
Experimental results are described which demonstrate the ability to switch a thyristor from its ON state to its OFF state by using a depletion layer formed by the application of gate bias to a trench-gate MOSFET integrated within the thyristor structure. The maximum controllable current is found to be a function of the gate bias voltage, the trench depth, and the ambient temperature. The maximum controllable current can be increased by increasing the trench depth and decreasing the p-base sheet resistance. The maximum controllable current decreases at high temperatures, as in the case of other MOS-bipolar devices, but is significantly better than for previous devices. The absolute values of the maximum turnoff current are well above 1000 A/cm/sup 2/ at room temperature and 500 A/cm/sup 2/ at 200 degrees C.<>
Keywords :
insulated gate field effect transistors; thyristors; 200 degC; ambient temperature; depletion-mode thyristors; gate bias; gate bias voltage; maximum controllable current; maximum turnoff current; p-base sheet resistance; trench depth; trench-gate MOSFET; MOSFET circuits; Switches; Temperature control; Thyristors; Voltage control;
fLanguage :
English
Journal_Title :
Electron Device Letters, IEEE
Publisher :
ieee
ISSN :
0741-3106
Type :
jour
DOI :
10.1109/55.43101
Filename :
43101
Link To Document :
بازگشت